{"error":0,"goodid":"9031499010","country":"\u5408\u8a08","good_data":{"id":"9031499010","name":"\u5176\u4ed6\u4f9b\u8a08\u91cf\u534a\u5c0e\u9ad4\u6676\u5713\u8868\u9762\u5fae\u7c92\u6c61\u67d3\u4e4b\u5149\u5b78\u5100\u5668\u53ca\u7528\u5177","ename":"OPTICAL INSTRUMENTS AND APPLIANCES FOR MEASURING SURTACE PATICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS","api_link":"http:\/\/portal-api.g0v.ronny.tw\/api\/goodid\/9031499010"},"data":[]}