{"error":0,"goodid":"90319020","time":"10811","good_data":{"id":"90319020","name":"\u4f9b\u8a08\u91cf\u534a\u5c0e\u9ad4\u6676\u5713\u8868\u9762\u5fae\u7c92\u6c61\u67d3\u4e4b\u5149\u5b78\u5100\u5668\u53ca\u7528\u5177\u4e4b\u96f6\u4ef6\u53ca\u9644\u4ef6","ename":"Parts and accessories of optical instruments and appliances for measuring surface particulate contamination on semiconductor wafers","api_link":"http:\/\/portal-api.g0v.ronny.tw\/api\/goodid\/90319020"},"data":[{"Country":"\u5408\u8a08","Weight":32,"WeightUnit":"KGM","Value":1454},{"Country":"\u65e5\u672c","Weight":10,"WeightUnit":"KGM","Value":793},{"Country":"\u7f8e\u570b","Weight":5,"WeightUnit":"KGM","Value":22},{"Country":"\u65b0\u52a0\u5761","Weight":1,"WeightUnit":"KGM","Value":34},{"Country":"\u4ee5\u8272\u5217","Weight":16,"WeightUnit":"KGM","Value":605}]}