{"error":0,"goodid":"90314991","time":"10811","good_data":{"id":"90314991","name":"\u5176\u4ed6\u4f9b\u8a08\u91cf\u534a\u5c0e\u9ad4\u6676\u5713\u8868\u9762\u5fae\u7c92\u6c61\u67d3\u4e4b\u5149\u5b78\u5100\u5668\u53ca\u7528\u5177","ename":"Optical instruments and appliances for measuring surtace particulate contamination on semiconductor wafers","api_link":"http:\/\/portal-api.g0v.ronny.tw\/api\/goodid\/90314991"},"data":[{"Country":"\u5408\u8a08","Weight":181,"WeightUnit":"KGM","Value":5298},{"Country":"\u65e5\u672c","Weight":45,"WeightUnit":"KGM","Value":2728},{"Country":"\u7f8e\u570b","Weight":99,"WeightUnit":"KGM","Value":1748},{"Country":"\u5fb7\u570b","Weight":32,"WeightUnit":"KGM","Value":642},{"Country":"\u5357\u97d3","Weight":5,"WeightUnit":"KGM","Value":180}]}